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【英文标准名称】:GuidetoScannerandTipRelatedArtifactsinScanningTunnelingMicroscopyandAtomicForceMicroscopy
【原文标准名称】:扫描隧道显微镜学和原子力显微镜学中扫描器和与触点相关物品的指南
【标准号】:ASTME2382-2004
【标准状态】:现行
【国别】:
【发布日期】:2004
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E42.14
【标准类型】:(Guide)
【标准水平】:()
【中文主题词】:
【英文主题词】:Abbeoffseterror;creep;dilation;hysteresis;nonlinearity;probe-samplemixing;AFM;STM;tipshape;proximalprobe;geometricmixing;imagereconstruction
【摘要】:1.1Allmicroscopesaresubjecttoartifacts.Thepurposeofthisdocumentistoprovideadescriptionofcommonlyobservedartifactsinscanningtunnelingmicroscopy(STM)andatomicforcemicroscopy(AFM)relatingtoprobemotionandgeometricconsiderationsofthetipandsurfaceinteraction,provideliteraturereferencesofexamplesand,wherepossible,toofferaninterpretationastothesourceoftheartifact.Becausethescannedprobemicroscopyfieldisaburgeoningone,thisdocumentisnotmeanttobecomprehensivebutrathertoserveasaguidetopracticingmicroscopistsastopossiblepitfallsonemayexpect.Theabilitytorecognizeartifactsshouldassistinreliableevaluationofinstrumentoperationandinreportingofdata.1.2Alimitedsetoftermswillbedefinedhere.Afulldescriptionofterminologyrelatingtothedescription,operation,andcalibrationofSTMandAFMinstrumentsisbeyondthescopeofthisdocument.
【中国标准分类号】:N32
【国际标准分类号】:17_040_20
【页数】:20P.;A4
【正文语种】: